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Materials Science Programs & Projects

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Determinations of Boron Deposit Quality by Neutron Depth Profiling
Last Updated Date: 10/01/2012

Straw detectors are a new concept in position-sensitive neutron detectors recently developed by Proportion Technology Inc. The detectors are … more

Chemical Metrology for Metals, Ores, and Related Materials
Last Updated Date: 10/01/2012

A wide range of industrial sectors and their customers and suppliers are involved directly with NIST in the prioritization and development of … more

Nanomagnetic Imaging
Last Updated Date: 08/20/2012

The microscopic arrangement of the magnetic structure within a thin metal film plays a fundamental role in many technological applications ranging … more

Theory and Modeling of Materials for Renewable Energy
Last Updated Date: 07/12/2012

Renewable energy sources such as solar energy are attractive alternatives to fossil fuels because of their abundant supply and pollution-free power … more

Infrared Imaging Beyond the Diffraction Limit
Last Updated Date: 07/09/2012

There are a variety of tools for characterizing nanoscale morphology and structure, such as scanning probe, scanning electron, and transmission … more

Light-matter Interactions in Semiconductor Nanostructures
Last Updated Date: 05/30/2012

The quantum optics of light interacting with semiconductor-based nanostructures is being studied to extend concepts of entanglement and coherence … more

Designing the Nanoworld: Nanostructures, Nanodevices, and Nanooptics
Last Updated Date: 05/30/2012

Nanoscale theory of the electronic, optical and mechanical properties of ultrasmall structures, devices and their dynamical operation and the … more

Quantum Conductance Project/Graphene-Based Quantum Metrology
Last Updated Date: 10/03/2011

The goal of the Quantum Conductance Project is to develop graphene metrology for intrinsic electrical standards, specifically … more

OOF: Finite Element Analysis of Microstructures
Last Updated Date: 02/17/2011

The OOF project seeks to provide flexible software for finite-element modeling the behavior of real microstructures, with meshes derived from … more

Advanced Linear and Nonlinear Optical Metrology in support of next-generation Lithography
Last Updated Date: 11/09/2010

High precision linear and nonlinear optics of next-generation lithographic techniques is measured and characterized to enable these technologies. more

Fabrication and Metrology of Novel Magnetic Tunnel Junctions in the Ultra-thin Barrier Limit
Last Updated Date: 10/20/2010

Magnetic tunnel junctions, nanostructured by highly charged ions, are being probed and characterized to establish the foundation for novel … more

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