Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||John F. Seely; Jack L. Glover; Lawrence T. Hudson; Yuri Ralchenko; Nino R. Pereira; U. Feldman; C. D. Stefan;|
|Title:||Measurement of High-Energy (10 keV to 60 keV) X-Ray Spectral Line Widths with eV Accuracy|
|Published:||August 08, 2014|
|Abstract:||A high resolution crystal spectrometer (HRCS) utilizing a crystal in transmission geometry has been developed and experimentally optimized to measure the line widths of emission lines in the 10 keV to 60 keV energy range with eV accuracy. The spectrometer achieves high spectral resolution by utilizing crystal planes with small lattice spacings (down to 0.05 nm), a large crystal bending radius, and Rowland circle diameter (965 mm), and an image plate detector with high spatial resolution (60 μm in the case of the Fuji TR image plate). High resolution W L and K laboratory test spectra in the 10 keV to 60 keV range and Ho K spectra near 47 keV recorded at the LLNL Titan laser facility are presented.|
|Citation:||Review of Scientific Instruments|
|Keywords:||High resolution transmission spectra, crystal spectrometer, tungsten, holmium, line width|
|PDF version:||Click here to retrieve PDF version of paper (505KB)|