Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter

Published

December 13, 2014

Author(s)

Guangfan Jiao, Jiwu Lu, Jason Campbell, Jason Ryan, Kin P. Cheung, Chadwin D. Young, Gennadi Bersuker

Abstract

This work utilizes device-level eye-diagram measurements to examine NBTI-induced changes in timing jitter at circuit speeds. The measured jitter is examined for a variety of ring-oscillator and pseudo-random gate patterns. The ring-oscillator patterns were chosen to mimic typical NBTI reliability characterizations while the pseudo-random patterns act as an approximation for real world random logic. Our observations indicate that NBTI-induced jitter is gate pattern-dependent and most severe for the pseudo-random case. Collectively, this work strongly suggests that typical NBTI ring-oscillator characterization methods are insensitive to random logic timing jitter.

Citation

IEEE Transactions on Device and Materials Reliability

Pub Type

Journals

Download Paper

Local Download

Keywords

eye-diagram, jitter, NBTI, reliability

Citation

Jiao, G. , Lu, J. , Campbell, J. , Ryan, J. , Cheung, K. , Young, C. and Bersuker, G. (2014), Device-Level Experimental Observations of NBTI-Induced Random Timing Jitter, IEEE Transactions on Device and Materials Reliability, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=916021 (Accessed April 19, 2024)