NIST logo

Publication Citation: Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies

NIST Authors in Bold

Author(s): Gheorghe Stan; Santiago D. Solares Rivera;
Title: Frequency, amplitude, and phase measurement in contact resonance atomic force microscopies
Published: March 12, 2014
Abstract: We analysed the resonance frequency, amplitude, and phase response of the first two eigenmodes of two contact-resonance atomic force microscopy (CR-AFM) configurations, differing in the method used to excite the system (cantilever base vs. sample excitation). We discussed similarities and differences in the observables, as well as the different effect of the tip-sample contact properties on those observables in each configuration. Finally, we explored the expected accuracy of CR-AFM using phase-locked loops, providing a quantification of the typical errors incurred during measurement.
Citation: Beilstein Journal of Nanotechnology
Keywords: dynamic AFM; contact-resonance AFM; viscoelasticity; phase-locked loop; frequency modulation
Research Areas: Nanotechnology, Atomic force microscopy (AFM)
PDF version: PDF Document Click here to retrieve PDF version of paper (3MB)