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|Author(s):||Jan Obrzut; Nathan D. Orloff; Oleg A. Kirillov;|
|Title:||Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity|
|Published:||May 15, 2014|
|Abstract:||A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials development and production. Non-contact measurement is performed in WR-90 waveguide configuration in the X-band frequency band from 6 GHz to 12 GHz. The presented semi-empirical perturbation model correlates the experimental quality factor and the specimen volume with the specimen imaginary part of permittivity and conductance. The measurement is illustrated on conducting carbon nanotube films having volumes in the range of 10-5 cm3 and conductivity of 50 S/cm.|
|Proceedings:||Proceedings of the 2014 IEEE International Instrumentation and Measurement Technology|
|Pages:||pp. 816 - 818|
|Dates:||May 12-15, 2014|
|Keywords:||non contact measurement, resonant cavity, microwave conductivity, carbon nanotubes.|
|Research Areas:||Nanostructured Materials, Carbon Nanotubes, Nanocomposites, Characterization, Nanometrology, and Nanoscale Measurements|
|DOI:||http://dx.doi.org/10.1109/I2MTC.2014.6860856 (Note: May link to a non-U.S. Government webpage)|