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NIST Authors in Bold
|Author(s):||Joel C. Weber; Paul T. Blanchard; Aric W. Sanders; Atif A. Imtiaz; Thomas M. Wallis; Kevin J. Coakley; Kristine A. Bertness; Pavel Kabos; Norman A. Sanford; Victor M. Bright;|
|Title:||Gallium Nitride Nanowire Probe for Near-Field Scanning Microwave Microscopy|
|Published:||January 15, 2014|
|Abstract:||We report on the fabrication of a GaN nanowire probe for near-field scanning microwave microscopy. A single nanowire was Pt-bonded to a commercial Si cantilever prior to evaporation of a Ti/Al coating to provide a microwave signal pathway. Testing over a microcapacitor calibration sample shows the probe to have capacitance resolution of at least 0.7 fF with improved sensitivity and reduced uncertainty compared with a commercial microwave probe. High strength of the defect-free nanowire enabled it to maintain a tip radius of 150 nm after multiple contact-mode scans while demonstrating nanometer-scale topographical resolution.|
|Citation:||Applied Physics Letters|
|Research Areas:||Nanoelectromechanical systems (NEMS)|
|DOI:||http://dx.doi.org/10.1063/1.4861862 (Note: May link to a non-U.S. Government webpage)|