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Publication Citation: Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples

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Author(s): Yu Lei; Raghu N. Kacker;
Title: Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples
Published: January 09, 2014
Abstract: A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy to software product lines. A unique challenge in these works is dealing with a potentially large number of constraints among different features. In this paper, we propose a novel constraint handling strategy that uses minimum invalid tuples (MITs) as an alternative of traditional constraint solver. Our approach systematically derives all MITs from a software product line, and uses them to quickly determine the validity of a test configuration during test generation. We report a test generation tool called LOOKUP that integrates the proposed constraint handling strategy with a general test generation algorithm called IPOG-C. Experimental results show that LOOKUP performs considerably better than two existing test generation tools in terms of test size and execution time.
Conference: 15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)
Proceedings: 15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)
Location: Miami, FL
Dates: January 9-11, 2014
Keywords: Combinatorial Testing; Constraints; covering Arrays Feature Model;
Research Areas: Software, Math
PDF version: PDF Document Click here to retrieve PDF version of paper (225KB)