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|Author(s):||Yu Lei; Raghu N. Kacker;|
|Title:||Combinatorial Test Generation for Software Product Lines Using Minimum Invalid Tuples|
|Published:||January 09, 2014|
|Abstract:||A software product line is a set of software systems that share some common features. Several recent works have been reported that apply combinatorial testing, a very effective testing strategy to software product lines. A unique challenge in these works is dealing with a potentially large number of constraints among different features. In this paper, we propose a novel constraint handling strategy that uses minimum invalid tuples (MITs) as an alternative of traditional constraint solver. Our approach systematically derives all MITs from a software product line, and uses them to quickly determine the validity of a test configuration during test generation. We report a test generation tool called LOOKUP that integrates the proposed constraint handling strategy with a general test generation algorithm called IPOG-C. Experimental results show that LOOKUP performs considerably better than two existing test generation tools in terms of test size and execution time.|
|Conference:||15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)|
|Proceedings:||15th IEEE International Symposium on High Assurance Systems Engineering (HASE 2014)|
|Pages:||pp. 65 - 72|
|Dates:||January 9-11, 2014|
|Keywords:||Combinatorial Testing, Constraints, covering Arrays Feature Model|
|Research Areas:||Software, Math|
|DOI:||http://dx.doi.org/10.1109/HASE.2014.18 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (225KB)|