Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Itzel Dominguez; David R. Kuhn; Raghu N. Kacker; Yu Lei;|
|Title:||CCM: A Tool for Measuring Combinatorial Coverage of System State Space|
|Published:||October 10, 2013|
|Abstract:||This poster presents some measures of combinatorial coverage that can be helpful in estimating residual risk related to insufficient testing of rare interactions, and a tool for computing these measures.|
|Conference:||ACM / IEEE International Symposium on Empirical Software Engineering and Measurement|
|Pages:||pp. 291 - 291|
|Dates:||October 10-11, 2013|
|Keywords:||combinatorial testing, factor covering array, state-space coverage, t-way testing, t-way testing,|
|Research Areas:||Information Technology|
|DOI:||http://dx.doi.org/10.1109/ESEM.2013.44 (Note: May link to a non-U.S. Government webpage)|