Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Vladimir P. Oleshko; Elissa H. Williams; Albert Davydov; Sergiy Krylyuk; Abhishek Motayed; Dmitry A. Ruzmetov; Thomas F. Lam; Henri J. Lezec; Albert A. Talin;|
|Title:||Analytical Electron Microscopy of Semiconductor Nanowire Functional Materials and Devices for Emerging Applications.|
|Published:||October 02, 2013|
|Abstract:||Functionalized individual semiconductor nanowires (SNWs) and 3D SNW arrays attract a continuously growing interest for applications in optoelectronics, sensing, and energy storage. High-resolution field-emission analytical (S)TEM enables critical insights into the morphology, crystalline and electronic structures and chemical compositions of single-crystalline high-aspect-ratio SNWs as perspective building blocks suitable for both a large scale-up synthesis and fabrication. Furthermore, SNW-based lab-on-a-chip devices may allow direct correlation between functional properties tailored for specific performance with the heterostructure morphology and atomic arrangement of the nanoscale structure being analyzed in various (S)TEM modes.|
|Citation:||Journal of Physics Conference Proceedings|
|Pages:||pp. 1 - 4|
|Research Areas:||Nanomaterials, Thin-Films|
|DOI:||http://dx.doi.org/10.1088/1742-6596/471/1/012017 (Note: May link to a non-U.S. Government webpage)|