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Publication Citation: SERIES RESISTANCE: A MONITOR FOR HOT CARRIER STRESS

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Author(s): Jason P. Campbell; Serghei Drozdov; Kin P. Cheung; Richard G. Southwick; Jason T. Ryan; John S. Suehle; Anthony Oates;
Title: SERIES RESISTANCE: A MONITOR FOR HOT CARRIER STRESS
Published: January 31, 2013
Abstract: In this work, we examine a series resistance extraction technique which yields accurate values from single nano-scale devices. The series resistance values, derived from this extraction technique, are shown to be sensitive to hot carrier degradation and might possibly serve as new technique to monitor reliability in advanced devices.
Conference: 2012 IEEE International Integrated Reliability Workshop
Proceedings: 2012 IEEE International Integrated Reliability Workshop Final Report
Pages: pp. 157 - 160
Location: S. Lake Tahoe, CA
Dates: October 14-18, 2012
Research Areas: Characterization