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NIST Authors in Bold
|Author(s):||Jason P. Campbell; Serghei Drozdov; Kin P. Cheung; Richard G. Southwick; Jason T. Ryan; John S. Suehle; Anthony Oates;|
|Title:||SERIES RESISTANCE: A MONITOR FOR HOT CARRIER STRESS|
|Published:||January 31, 2013|
|Abstract:||In this work, we examine a series resistance extraction technique which yields accurate values from single nano-scale devices. The series resistance values, derived from this extraction technique, are shown to be sensitive to hot carrier degradation and might possibly serve as new technique to monitor reliability in advanced devices.|
|Conference:||2012 IEEE International Integrated Reliability Workshop|
|Proceedings:||2012 IEEE International Integrated Reliability Workshop Final Report|
|Pages:||pp. 157 - 160|
|Location:||S. Lake Tahoe, CA|
|Dates:||October 14-18, 2012|