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|Author(s):||Jan Obrzut; Oleg A. Kirillov;|
|Title:||Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters|
|Published:||May 06, 2013|
|Abstract:||Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with complex impedance and propagation constant from which we determine the films surface conductance, coefficient of reflectance and transmittance. The measurement is illustrated on films of gold, 4 nm to 12 nm thick, which after percolation from individual nanoparticles resemble a continuous conductor. The presented methodology accurately captures the insulator to conductor transition, and can be used to determine microwave characteristics of such materials.|
|Conference:||2013 IEEE International Instrumentation and Measurement Technology Conference|
|Proceedings:||RF/Microwave Materials Characterization, Proceedings of the 2013 IEEE International Instrumentation and Measurement Technology Conference|
|Pages:||pp. 912 - 915|
|Dates:||May 6-9, 2013|
|Keywords:||microwave conductivity, thin metallic films, conductivity percolation, coplanar waveguides|
|Research Areas:||Nanostructured Materials, Thin-Films, Characterization, Nanometrology, and Nanoscale Measurements|
|DOI:||http://dx.doi.org/10.1109/I2MTC.2013.6555548 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (996KB)|