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Publication Citation: Real-Time Size Discrimination and Elemental Analysis of Gold Nanoparticles using ES-DMA coupled to ICP-MS

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Author(s): Sherrie R. Elzey; De-Hao D. Tsai; Lee L. Yu; Michael R. Winchester; Michael E. Kelley; Vincent A. Hackley;
Title: Real-Time Size Discrimination and Elemental Analysis of Gold Nanoparticles using ES-DMA coupled to ICP-MS
Published: January 22, 2013
Abstract: We report the development of a hyphenated instrument with the capacity to quantitatively characterize aqueous suspended gold nanoparticles (AuNPs) based on a combination of gas-phase size separation, particle counting, and elemental analysis. A customized electrospray-differential mobility analyzer (ES-DMA) was used to achieve real-time upstream size discrimination. A condensation particle counter (CPC) and inductively coupled plasma mass spectrometer (ICP-MS) were employed as downstream detectors, providing information on number density and elemental composition, respectively, of aerosolized AuNPs versus the upstream size selected by ES-DMA. A gas-exchange device was designed and optimized to improve the conversion of air flow (from the electrospray) to argon flow required to sustain the ICP-MS plasma, the key compatibility issue for instrumental hyphenation. Our work provides the proof of concept and a working prototype for utilizing this construct to successfully measure (1) number-based and mass-based distributions; (2) elemental compositions of nanoparticles classified by size, where the size classification and elemental analysis are performed within a single experiment; (3) particle concentrations in both solution (before size discrimination) and aerosol (after size discrimination) phases; (4) the number of atoms per nanoparticle or the nanoparticle density.
Citation: Analytical and Bioanalytical Chemistry
Volume: 405
Pages: pp. 2279 - 2288
Keywords: DMA, electrospray, gold, nanoparticle, ICP-MS, quantitative analysis
Research Areas: Instrumentation, Nanomaterials, Nanotechnology, Mass Spectrometry, Characterization, Nanometrology, and Nanoscale Measurements
DOI: http://dx.doi.org/10.1007/s00216-012-6617-z  (Note: May link to a non-U.S. Government webpage)