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|Author(s):||Heayoung Yoon; Paul M. Haney; Dmitry A. Ruzmetov; Hua Xu; Marina S. Leite; Behrang H. Hamadani; Albert A. Talin;|
|Title:||Local electrical characterizations of cadmium telluride solar cells using low energy electron beam|
|Published:||October 01, 2013|
|Abstract:||We investigate local electronic properties of cadmium telluride solar cells using electron beam induced current (EBIC) measurements with current-collecting patterned contacts. EBIC measurements are performed with a spatial resolution as high as ≈20 nm both on the top surface and throughout the cross-section of the device, revealing an enhanced carrier collection in the vicinity of grain boundaries. Furthermore, we measure local current-voltage characteristics using contacts with dimension both larger (≈5 µm × 10 µm) and smaller (≈1 µm × 1 µm) than the device thickness (≈4 m), finding that the value of local open-circuit voltage is also larger near grain boundaries.|
|Citation:||Solar Energy Materials and Solar Cells|
|Pages:||pp. 499 - 504|
|Keywords:||solar cell, thin film, CdTe, grain boundary, electron beam induced current, EBIC, cross section, focused ion beam, FIB|
|Research Areas:||Electron microscopy (EM, TEM, SEM, STEM), Solar|
|DOI:||http://dx.doi.org/10.1016/j.solmat.2013.07.024 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (843KB)|