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|Author(s):||Weston L. Tew; William E. Murdock; Michal J. Chojnacky; Dean C. Ripple;|
|Title:||The Residual and Temperature-Dependent Resistance of Reference-Grade Platinum Wire Below 13.8 K|
|Published:||September 12, 2013|
|Abstract:||We report the Residual Resistance Ratio (RRR) and resistance ratio W(GaMP) (gallium melting point) values for well-annealed samples of the original SRM 1967, its contemporary substitute SRM 1967a, and a collection of NIST capsule-type SPRTs. The RRR dependence on annealing temperature is investigated and our results are compared with calculations based on contemporary chemical impurity analyses. The data are corrected to remove temperature-dependent components to derive the RRR at 0 K using W(T) data over the range 1 K|
|Conference:||9th International Temperature Symposium|
|Proceedings:||Temperature, Its Measurement and Control in Science and Industry|
|Pages:||pp. 457 - 462|
|Dates:||March 20-23, 2012|
|Keywords:||Platinum, Standard Reference Material, Residual Resistance Ratio, Pt-67|
|DOI:||http://dx.doi.org/10.1063/1.4819584 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (141KB)|