NIST logo

Publication Citation: Submicrometer-Resolution Polychromatic 3D X-Ray Microscopy

NIST Authors in Bold

Author(s): B C. Larson; Lyle E. Levine;
Title: Submicrometer-Resolution Polychromatic 3D X-Ray Microscopy
Published: January 15, 2013
Abstract: The ability to study the structure, microstructure, and evolution of materials with increasing spatial resolution is fundamental to achieving a full understanding of the underlying science of materials. Polychromatic 3D x-ray microscopy (3DXM) is a recently-developed, non-destructive, diffraction technique that enables crystallographic phase identification, determination of local crystal orientations, and determination of the deviatoric elastic strain tensor with submicrometer spatial resolution in all three dimensions. With the added capability of an energy scanning incident beam monochromator, the determination of absolute lattice parameters is enabled allowing specification of the complete elastic strain tensor with 3D spatial resolution. The methods associated with 3DXM are described and key applications of 3DXM are discussed including studies of deformation in metals and semiconductors, thermal grain growth in polycrystalline aluminum, the metal-insulator transition in nanoplatelet VO2, indentation deformation, interface strengths in metal-matrix composites, and electromigration processes. Finally, the outlook for future developments associated with this technique is described.
Citation: Journal of Applied Crystallography
Volume: 46
Pages: pp. 153 - 164
Keywords: X-ray diffraction; nanoscale diffraction; 3D X-ray diffraction; X-ray imaging review
Research Areas: Materials Science
PDF version: PDF Document Click here to retrieve PDF version of paper (1MB)