Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publication Citation: Micromagnetic investigation of periodic cross-tie/vortex wall geometry

NIST Authors in Bold

Author(s): Michael J. Donahue;
Title: Micromagnetic investigation of periodic cross-tie/vortex wall geometry
Published: May 18, 2012
Abstract: A systematic series of micromagnetic simulations on periodic cross-tie/vortex wall structures in an ideal soft film at various width, thickness, and period lengths is performed. For each width and thickness a natural period length is found which has minimal energy density for walls of this type. For each width a critical thickness is determined below which the natural period length is infinite; for films thinner than this the pure Neel wall has lower energy than any cross-tie/vortex wall. Details of the origin of the energy reduction in cross-tie/vortex walls as compared to Neel walls is also examined, and canting inside cross-tie and vortex structures in films thicker than 1 exchange length is explained.
Citation: Advances in Condensed Matter Physics
Volume: 2012
Pages: 8 pp.
Keywords: Micromagnetic modeling, cross-ties, vortices, Neel walls
Research Areas: Thin-Films, Nanomagnetics, Modeling
DOI: http://dx.doi.org/10.1155/2012/908692  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (3MB)