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|Author(s):||Michael J. Donahue;|
|Title:||Micromagnetic investigation of periodic cross-tie/vortex wall geometry|
|Published:||May 18, 2012|
|Abstract:||A systematic series of micromagnetic simulations on periodic cross-tie/vortex wall structures in an ideal soft film at various width, thickness, and period lengths is performed. For each width and thickness a natural period length is found which has minimal energy density for walls of this type. For each width a critical thickness is determined below which the natural period length is infinite; for films thinner than this the pure Neel wall has lower energy than any cross-tie/vortex wall. Details of the origin of the energy reduction in cross-tie/vortex walls as compared to Neel walls is also examined, and canting inside cross-tie and vortex structures in films thicker than 1 exchange length is explained.|
|Citation:||Advances in Condensed Matter Physics|
|Keywords:||Micromagnetic modeling, cross-ties, vortices, Neel walls|
|Research Areas:||Thin-Films, Nanomagnetics, Modeling|
|DOI:||http://dx.doi.org/10.1155/2012/908692 (Note: May link to a non-U.S. Government webpage)|
|PDF version:||Click here to retrieve PDF version of paper (3MB)|