Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Francesco Intravaia; Stefan T. Koev; Il Woong Jung; Albert A. Talin; Paul S. Davids; Ricardo Decca; Vladimir A. Aksyuk; Diego A. Dalvit; Daniel Lopez;|
|Title:||Strong Casimir force reduction by metallic surface nanostructuring|
|Published:||September 27, 2013|
|Abstract:||The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of engineering this force remains elusive, as many complex EM modes over a broad energy scale contribute simultaneously. Here we nanostructured one of two interacting gold surfaces into a high aspect ratio lamellar grating with 100 nm features. For inter-surface separation distances d above ≈ 400 nm, the measured Casimir force in vacuum decreases faster than the d^-4 power-law, reducing by up to a factor of 2 compared to the prediction of the proximity force approximation, valid for planar-like geometries. The strong force suppression, in agreement with our numerical analysis, is inconsistent with either perfect electrical conductivity or an effective medium description, and surface plasmon-like states with evanescent EM fields may play an important role. This work opens new possibilities for control of this fluctuation-induced interaction via material properties and geometric structure.|
|Keywords:||Casimir force, nanofabrication, nanostructure, vacuum fluctuations, plasmons, force measurement, MEMS, NEMS, microelectromechanical, nanoelectromechanical, e-beam, electroplating|
|Research Areas:||Nanophysics, Nanoelectromechanical systems (NEMS), Nanostructured Materials, Nanofabrication, Nanomanufacturing, and Nanoprocessing, Optical Properties of Materials, Electron beam lithography (EBL), Optical Physics, Theoretical Computation and Modeling, Characterization, Nanometrology, and Nanoscale Measurements, Microelectromechanical systems (MEMS), Quantum Physics|
|PDF version:||Click here to retrieve PDF version of paper (2MB)|