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Publication Citation: Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports

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Author(s): Dylan F. Williams;
Title: Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports
Published: January 01, 2012
Abstract: We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port imperfections to differing degrees.
Citation: IEEE Transactions on Terahertz Science and Technology
Volume: 2
Issue: 1
Pages: pp. 144 - 152
Keywords: Calibration, microwave, millimeter-wave, submillimeter wave, vector network analyzer
Research Areas: Microwave Measurement Services
DOI: http://dx.doi.org/10.1109/TTHZ.2011.2167833  (Note: May link to a non-U.S. Government webpage)
PDF version: PDF Document Click here to retrieve PDF version of paper (1MB)