| Author(s): |
Dylan F. Williams; |
| Title: |
Comparison of Sub-Millimeter-Wave Scattering-Parameter Calibrations with Imperfect Electrical Ports |
| Published: |
January 01, 2012 |
| Abstract: |
We develop a metric to quantify the accuracy with which measured scattering parameters can be cascaded. We use the metric to compare four rectangular-waveguide calibration strategies at sub-millimeter wavelengths that correct for electrical-port imperfections to differing degrees. |
| Citation: |
IEEE Transactions on Terahertz Science and Technology |
| Volume: |
2 |
| Issue: |
1 |
| Pages: |
pp. 144 - 152 |
| Keywords: |
Calibration; microwave; millimeter-wave; submillimeter wave; vector network analyzer |
| Research Areas: |
Microwave Measurement Services |
