Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).
NIST Authors in Bold
|Author(s):||Norman A. Sanford; F Brizuela; Kristine A. Bertness;|
|Title:||High resolution full-field imaging of nanostructures using compact extreme ultraviolet lasers|
|Published:||July 21, 2008|
|Abstract:||Recent advances in the development of high peak brightness table-top extreme ultraviolet (EUV) and soft x-ray (SRX) lasers have opened new opportunities for the demonstration of compact full-field EUV/SXR microscopes capable of capturing images with short exposures down to a single laser shot. We demonstrate the practical application of tabletop zone plate EUV microscopes that can image nanostructures with a spatial resolution of 54 nm and below and exposure times as short as 1.2 ns, the duration of a single laser shot.|
|Citation:||Journal of Physics Conference Proceedings|
|Pages:||pp. 1 - 3|
|Keywords:||GaN nanowires, nano-mechanics, nano-mechanical resonators, electro-mechanical resonators, piezoresistivity|
|Research Areas:||Nanowires, Nanomaterials, Nanomanufacturing|
|PDF version:||Click here to retrieve PDF version of paper (463KB)|