NIST logo

Publication Citation: Electrically detected magnetic resonance in dielectric semiconductor systems of current interest

NIST Authors in Bold

Author(s): Patrick Lenahan; Corey Cochrane; Jason P. Campbell; Jason T. Ryan;
Title: Electrically detected magnetic resonance in dielectric semiconductor systems of current interest
Published: May 04, 2011
Abstract:
Pages: 30 pp.
Research Areas: Characterization