NIST Authors in Bold
| Author(s): | Shu Zee A. Lo; David R. Novotny; Erich N. Grossman; Edwin J. Heilweil; |
|---|---|
| Title: | Pulsed terahertz bi-directional reflection distribution function (BRDF) measurements of materials and obscurants |
| Published: | June 13, 2011 |
| Abstract: | A pulsed terahertz imaging system modified to perform angular detection of light for quantitatively characterizing reflection and scattering from samples is reported. Reflection from a gold mirror shows that the full width half maximum (FWHM) of the terahertz beam angular spread is <1° with signal-to-noise of 65 dB. Two samples, a paper index card and a corduroy cloth sample were tested. The index card reflects ca. 1% of the incident terahertz energy with similar angular spreading while the corduroy sample reflected approximately 0.01% of the incident terahertz energy with FWHM of 5-10°. The corduroy sample also exhibits temporal pulse scattering as a function of angle which correlates with direct frequency domain measurements. |
| Conference: | SPIE Defense, Security & Sensing |
| Proceedings: | Paper 8022-14, Session: "Passive Milllimeter Wave Imaging Technology XIV" |
| Volume: | 8022 |
| Location: | Orlando, FL |
| Dates: | April 24-29, 2011 |
| Keywords: | BRDF; concealed threat detection; terahertz reflection and scattering; terahertz imaging |
| Research Areas: | Terahertz Metrology |