| Author(s): |
Lawrence T. Hudson; C M. O'Brien; U. Feldman; Stephen M. Seltzer; Hye-Sook Park; John F. Seely; |
| Title: |
Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range |
| Published: |
April 15, 2011 |
| Abstract: |
Two quartz (10-11) crystals were cylindrically bent to 25.4 cm radius of curvature and were mounted in identical Cauchois type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5 % absolute accuracy using narrow bandwidth x-ray source fluences in the 20 keV to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x-ray emission levels from laser-produced plasmas and other laboratory sources. |
| Citation: |
Optics Letters |
| Volume: |
36 |
| Pages: |
pp. 1835 - 1837 |
| Keywords: |
diffraction; x-ray spectroscopy; x-ray |
| Research Areas: |
Radiation Physics, Calibrations (Ionizing Radiation) |
| PDF version: |
 Click here to retrieve PDF version of paper (309KB) |
