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|Author(s):||Lawrence T. Hudson; C M. O\'Brien; Uri Feldman; Stephen M. Seltzer; Hye-Sook Park; John F. Seely;|
|Title:||Efficiency calibrations of cylindrically bent transmission crystals in the 20 keV to 80 keV x-ray range|
|Published:||April 15, 2011|
|Abstract:||Two quartz (10-11) crystals were cylindrically bent to 25.4 cm radius of curvature and were mounted in identical Cauchois type transmission spectrometers, and the crystal diffraction efficiencies were measured to 5 % absolute accuracy using narrow bandwidth x-ray source fluences in the 20 keV to 80 keV energy range. The measured integrated reflectivity values were compared to calculations performed using a computational model that accounts for the diffraction geometry of the bent transmission crystal. These crystal calibrations enable the accurate measurement of absolute hard x-ray emission levels from laser-produced plasmas and other laboratory sources.|
|Pages:||pp. 1835 - 1837|
|Keywords:||diffraction, x-ray spectroscopy, x-ray|
|Research Areas:||Radiation Physics, Calibrations (Ionizing Radiation)|
|PDF version:||Click here to retrieve PDF version of paper (316KB)|