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|Author(s):||Brian G. Burke; David A. LaVan;|
|Title:||Characterization of a High-Speed (10 MHz) Quadrant Avalanche Photodiode for Measuring Cantilever Displacement|
|Published:||September 16, 2012|
|Abstract:||We have measured the characteristics of a high-speed (10 MHz) quadrant avalanche photodiode (APD) in order to detect high frequency resonant oscillations and tip displacements of a cantilever. Currently, no high-speed quadrant detectors with a response bandwidth in the megahertz range are available, and experiments on the order of a few microseconds cannot be studied. A maximum gain of ~1500 and sensitivity of ~4.6 mV/μm were achieved at an optical power of 50 nW, using an optical spot diameter of 1.0 mm. We investigated the performance of the quadrant APD and measured the frequency response.|
|Citation:||Applied Physics Letters|
|Pages:||pp. 127 - 132|
|Keywords:||cantilever, AFM, quadrant, avalanche, photodetector, APD|
|Research Areas:||Microelectromechanical systems (MEMS), Instrumentation, Atomic force microscopy (AFM)|
|DOI:||http://dx.doi.org/10.1007/s00340-012-5162-y (Note: May link to a non-U.S. Government webpage)|