| Author(s): |
Brian G. Burke; David A. LaVan; James G. Kushmerick; |
| Title: |
Characterization of a High-Speed (10 MHz) Quadrant Avalanche Photodiode for Measuring Cantilever Displacement |
| Published: |
September 16, 2012 |
| Abstract: |
We have measured the characteristics of a high-speed (10 MHz) quadrant avalanche photodiode (APD) in order to detect high frequency resonant oscillations and tip displacements of a cantilever. Currently, no high-speed quadrant detectors with a response bandwidth in the megahertz range are available, and experiments on the order of a few microseconds cannot be studied. A maximum gain of ~1500 and sensitivity of ~4.6 mV/μm were achieved at an optical power of 50 nW, using an optical spot diameter of 1.0 mm. We investigated the performance of the quadrant APD and measured the frequency response. |
| Citation: |
Applied Physics Letters |
| Volume: |
109 |
| Issue: |
1 |
| Pages: |
pp. 127 - 132 |
| Keywords: |
cantilever, AFM, quadrant, avalanche, photodetector, APD |
| Research Areas: |
Microelectromechanical systems (MEMS), Instrumentation, Atomic force microscopy (AFM) |
| DOI: |
10.1007/s00340-012-5162-y (Note: May link to a non-U.S. Government webpage) |
