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NISTs High Frequency Metrology Programs: Current Capabilities and Future Directions
Published
Author(s)
Ronald A. Ginley
Abstract
There are several core areas that are covered by the NIST microwave metrology services. These include thermal noise, power, scattering-parameters (s-parameters), field strength and antenna parameters. The rapid change in technology and the current economic conditions have made us re-examine our services and to make changes where necessary. In this paper we will examine the current state of the microwave measurement services at NIST, discuss what changes are happening to those services and then give a glimpse at the future directions for the programs.
Proceedings Title
Symposium of Metrology, CENAM, 2010, Queretaro, Mexico
Ginley, R.
(2011),
NIST’s High Frequency Metrology Programs: Current Capabilities and Future Directions, Symposium of Metrology, CENAM, 2010, Queretaro, Mexico, Queretaro, -1
(Accessed March 28, 2024)