NIST logo

Publication Citation: Calibration of dynamic sensors for noncontact-atomic force microscopy

NIST Authors in Bold

Author(s): Gordon A. Shaw; Jon R. Pratt; Zeina J. Kubarych;
Title: Calibration of dynamic sensors for noncontact-atomic force microscopy
Published: August 12, 2011
Abstract: Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning fork-type sensors. The method eliminates uncertainties due to tip location, provides for direct calibration in ambient, liquid, ultrahigh vacuum (UHV), and cryogenic environments, and offers a route to measurements potentially traceable to the International System of Units (SI). The spring constants obtained with the dynamic calibration method agree with a traceable measurement made using instrumented indentation [1].
Conference: NCAFM 2010
Proceedings: Proceedings of the Workshop on SPM Standardization, NCAFM 2010
Pages: 2 pp.
Location: Kanizawa, -1
Dates: August 2-6, 2010
Keywords: atomic force microscopy; small mass; spring constant; calibration; nanotechnology
Research Areas: Mechanical Metrology