| Author(s): |
Gordon A. Shaw; Jon R. Pratt; Zeina J. Kubarych; |
| Title: |
Calibration of dynamic sensors for noncontact-atomic force microscopy |
| Published: |
August 12, 2011 |
| Abstract: |
Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning fork-type sensors. The method eliminates uncertainties due to tip location, provides for direct calibration in ambient, liquid, ultrahigh vacuum (UHV), and cryogenic environments, and offers a route to measurements potentially traceable to the International System of Units (SI). The spring constants obtained with the dynamic calibration method agree with a traceable measurement made using instrumented indentation [1]. |
| Conference: |
NCAFM 2010 |
| Proceedings: |
Proceedings of the Workshop on SPM Standardization, NCAFM 2010 |
| Pages: |
2 pp. |
| Location: |
Kanizawa, -1 |
| Dates: |
August 2-6, 2010 |
| Keywords: |
atomic force microscopy; small mass; spring constant; calibration; nanotechnology |
| Research Areas: |
Mechanical Metrology |
