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|Author(s):||Gordon A. Shaw; Jon R. Pratt; Zeina J. Kubarych;|
|Title:||Calibration of dynamic sensors for noncontact-atomic force microscopy|
|Published:||August 12, 2011|
|Abstract:||Access to quantitative information on surface forces in noncontact-atomic force microscopy (NC-AFM) requires the accurate calibration of several key sensor parameters. This work outlines a dynamic method for calibrating the spring constant of tuning fork-type sensors. The method eliminates uncertainties due to tip location, provides for direct calibration in ambient, liquid, ultrahigh vacuum (UHV), and cryogenic environments, and offers a route to measurements potentially traceable to the International System of Units (SI). The spring constants obtained with the dynamic calibration method agree with a traceable measurement made using instrumented indentation .|
|Proceedings:||Proceedings of the Workshop on SPM Standardization, NCAFM 2010|
|Dates:||August 2-6, 2010|
|Keywords:||atomic force microscopy, small mass, spring constant, calibration, nanotechnology|
|Research Areas:||Mechanical Metrology|