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Publication Citation: Intrinsic defects in perpendicularly magnetized multilayer thin films and nanostructures

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Author(s): Justin M. Shaw; Miles Olsen; June W. Lau; Michael L. Schneider; Thomas J. Silva; Olav Hellwig; Elizabeth Dobisz; Bruce D. Terris;
Title: Intrinsic defects in perpendicularly magnetized multilayer thin films and nanostructures
Published: October 26, 2010
Abstract: Intrinsic magnetic defects in perpendicularly magnetized nanostructures reduce the predictability of device and developing recording technologies. In addition to a distribution of local anisotropy fields, we show that such defects also exhibit variations in local anisotropy axes. The magnetic defects are identified by the application of in-plane and out-of-plane magnetic fields and magnetic force microscopy imaging. Those defects that control magnetization reversal in arrays of patterned Co/Pd multilayers are highly dependent on applied field orientation. The symmetry of the defects with respect to the applied field direction indicates that the anisotropy consists of a canted axis, deviating from the surface normal. Micromagnetic simulations confirm that variations in anisotropy axis can cause a significant change in reversal field depending on the location and orientation of the defects, consistent with experimental results.
Citation: Physical Review B
Volume: 82
Pages: pp. 144437-1 - 144437-7
Keywords: Nanomagnetics;magnetic nanostructures;magnetic defects;multilayers;thin films
Research Areas: Electron beam lithography (EBL), Magnetic materials, Nanomagnetics