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|Author(s):||Justin M. Shaw; Miles Olsen; June W. Lau; Michael L. Schneider; Thomas J. Silva; Olav Hellwig; Elizabeth Dobisz; Bruce D. Terris;|
|Title:||Intrinsic defects in perpendicularly magnetized multilayer thin films and nanostructures|
|Published:||October 26, 2010|
|Abstract:||Intrinsic magnetic defects in perpendicularly magnetized nanostructures reduce the predictability of device and developing recording technologies. In addition to a distribution of local anisotropy fields, we show that such defects also exhibit variations in local anisotropy axes. The magnetic defects are identified by the application of in-plane and out-of-plane magnetic fields and magnetic force microscopy imaging. Those defects that control magnetization reversal in arrays of patterned Co/Pd multilayers are highly dependent on applied field orientation. The symmetry of the defects with respect to the applied field direction indicates that the anisotropy consists of a canted axis, deviating from the surface normal. Micromagnetic simulations confirm that variations in anisotropy axis can cause a significant change in reversal field depending on the location and orientation of the defects, consistent with experimental results.|
|Citation:||Physical Review B|
|Pages:||pp. 144437-1 - 144437-7|
|Keywords:||Nanomagnetics,magnetic nanostructures,magnetic defects,multilayers,thin films|
|Research Areas:||Electron beam lithography (EBL), Magnetic materials, Nanomagnetics|