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Publication Citation: Methods for TEM analysis of NIST‰s SWCNT SRM

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Author(s): Roy H. Geiss; Elisabeth Mansfield; Jeffrey A. Fagan;
Title: Methods for TEM analysis of NIST‰s SWCNT SRM
Published: March 25, 2010
Abstract: The National Institute of Standards and Technology (NIST) is developing a series of single-walled carbon nanotube, SWCNT, reference materials, RMs, to provide researchers with well characterized materials for their applications. The SWCNT reference materials will be introduced as a series of three types of material: (1) raw soot characterized for composition, (2) purified (> 90 % SWCNT) bucky paper and (3) dispersed, length-sorted populations characterized by length. The first material, bulk raw soot, is expected to be certified for atomic composition by NIST‰s highest standards, making it a Standard Reference Material (SRM). For the second material, the raw soot will be further processed through dispersing, filtration and washing to yield a bucky paper sample, which will be certified for composition. In the third material, raw soot will be taken through a purification and length-sorting procedure to yield a series of surfactant-suspended, length sorted tubes classified as ,long,Š ,medium,Š and ,short.Š General measurements made on these materials include transmission electron microscopy (TEM), scanning electron microscopy (SEM), thermogravimetric analysis (TGA) and Raman, ultraviolet-visible-near infrared and fluorescence spectroscopy. TEM is used in the analysis of SWCNT as a qualitative technique which provides a measure of purity for a given sample. TEM allows for the characterization of nanotube type (i.e., multi-walled, single-walled) and the degree of bundling in the structures. Electron-diffraction information from isolated SWCNT samples using the TEM can also be used to characterize the chirality.
Conference: Microscopy and Microanalysis 2010
Proceedings: Microscopy and Microanalysis 2010 Proceedings
Location: Portland, OR
Dates: August 1-5, 2010
Keywords: Carbon nanotubes; SRM; standard reference material; TEM
Research Areas: Nanomaterials, Nanotech/Environment, Health & Safety, SRM (Engineering Materials)