| Author(s): |
James P. Randa; |
| Title: |
Simulator for Amplifier and Transistor Noise-Parameter Measurements |
| Published: |
June 18, 2010 |
| Abstract: |
This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given. |
| Conference: |
CPEM CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS |
| Proceedings: |
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010 |
| Pages: |
pp. 555 - 556 |
| Location: |
Daejeon, -1 |
| Dates: |
June 13-18, 2010 |
| Keywords: |
amplifier noise; measurement uncertainty; noise measurement; noise parameters; transistor noise |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (163KB) |
