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Publication Citation: Simulator for Amplifier and Transistor Noise-Parameter Measurements

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Author(s): James P. Randa;
Title: Simulator for Amplifier and Transistor Noise-Parameter Measurements
Published: June 18, 2010
Abstract: This paper describes a simulation program that was developed to compare the uncertainties that would be expected with different measurement strategies for the noise parameters of connectorized amplifiers and of amplifiers or transistors on wafers. Both type A and type B uncertainties are included. An illustrative example is given.
Conference: CPEM CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS
Proceedings: CPEM 2010: Conference on Precision Electromagnetics Measurement 2010
Pages: pp. 555 - 556
Location: Daejeon, -1
Dates: June 13-18, 2010
Keywords: amplifier noise; measurement uncertainty; noise measurement; noise parameters; transistor noise
Research Areas: Electromagnetics
PDF version: PDF Document Click here to retrieve PDF version of paper (167KB)