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|Author(s):||James R. Baker-Jarvis; Michael D. Janezic; Billy F. Riddle; Kim Sung;|
|Title:||Behavior of ε (omega} and tan δ of a Class of Low-Loss Materials|
|Published:||June 18, 2010|
|Abstract:||In this project we study the behavior of the permittivity and loss tangent of a class of materials that exhibit relaxation. For relaxation response we show that the permittivity is a monotonically decreasing function of frequency. Also, for many low-liss ceramics, glasses, crystals, and solid polymers it is found that the loss tangent increases nearly linearly with frequency. This linearity is explained in terms of the pulse-response function and the Sparks-King-Mills model. We show that the linearity may be used to extrapolate the loss tangent out of the measurement band|
|Proceedings:||CPEM 2010: Conference on Precision Electromagnetics Measurement 2010|
|Pages:||pp. 289 - 290|
|Dates:||June 13-18, 2010|
|Keywords:||Dielectric, loss tangent, low loss, microwave, millimeter wave, Dielectric, loss tangent, low loss, microwave, millimeter wave,|
|PDF version:||Click here to retrieve PDF version of paper (161KB)|