| Author(s): |
James R. Baker-Jarvis; Michael D. Janezic; Bill F. Riddle; Kim Sung; |
| Title: |
Behavior of ε (omega} and tan δ of a Class of Low-Loss Materials |
| Published: |
June 18, 2010 |
| Abstract: |
In this project we study the behavior of the permittivity and loss tangent of a class of materials that exhibit relaxation. For relaxation response we show that the permittivity is a monotonically decreasing function of frequency. Also, for many low-liss ceramics, glasses, crystals, and solid polymers it is found that the loss tangent increases nearly linearly with frequency. This linearity is explained in terms of the pulse-response function and the Sparks-King-Mills model. We show that the linearity may be used to extrapolate the loss tangent out of the measurement band |
| Proceedings: |
CPEM 2010: Conference on Precision Electromagnetics Measurement 2010 |
| Pages: |
pp. 289 - 290 |
| Location: |
Daejeon, -1 |
| Dates: |
June 13-18, 2010 |
| Keywords: |
Dielectric, loss tangent, low loss, microwave, millimeter wave, Dielectric, loss tangent, low loss, microwave, millimeter wave, |
| Research Areas: |
Electromagnetics |
| PDF version: |
 Click here to retrieve PDF version of paper (157KB) |
