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|Author(s):||Catherine A. Remley; Hugo Gomes; Alejandro Testera; Nuno B. Carvalho; Monica Barciela;|
|Title:||The Impact of Long-term Memory Effects on Diode Power Probes|
|Published:||May 15, 2010|
|Abstract:||This paper presents an analysis of long term memory effects on power measurements using diode power probes. It will be shown that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of Volterra Series, and then validated by simulations and measurements using a diode power probe.|
|Proceedings:||2010 IEEE MTT-S International Microwave Symposium Digest|
|Dates:||June 7-11, 2010|
|Keywords:||Diode Power Probe, Long-term Memory Effects, Nonlinear Device, Power Measurement|
|PDF version:||Click here to retrieve PDF version of paper (2MB)|