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Publication Citation: The Impact of Long-term Memory Effects on Diode Power Probes

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Author(s): Catherine A. Remley; Hugo Gomes; Alejandro Testera; Nuno B. Carvalho; Monica Barciela;
Title: The Impact of Long-term Memory Effects on Diode Power Probes
Published: May 15, 2010
Abstract: This paper presents an analysis of long term memory effects on power measurements using diode power probes. It will be shown that a power probe calibrated with a single-tone sinusoidal excitation can provide erroneous values when used with modulated signals. This fact is ascribed to the low-frequency response imposed by the power probe baseband circuit. This hypothesis is first theoretically demonstrated by use of Volterra Series, and then validated by simulations and measurements using a diode power probe.
Proceedings: 2010 IEEE MTT-S International Microwave Symposium Digest
Location: Anaheim, CA
Dates: June 7-11, 2010
Keywords: Diode Power Probe, Long-term Memory Effects, Nonlinear Device, Power Measurement
Research Areas: Wireless
PDF version: PDF Document Click here to retrieve PDF version of paper (2MB)