Publication Citation
NIST Authors in Bold
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| Author(s): | Samuel M. Stavis; Jon C. Geist; Michael Gaitan; |
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| Title: | Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion |
| Published: | August 11, 2010 |
| Abstract: | A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitations to nanoparticle separation, and the direct measurement of size distribution through fluorescence microscopy and analysis of the nanofluidic size exclusion of individual nanoparticles. The presented results indicate that an optimized approach could be used for nanoparticle sorting and measurement of nanoparticle morphology and protein binding. |
| Citation: | Lab on A Chip |
| Pages: | 4 pp. |
| Research Areas: | Nanoparticles, Nanotech/Environment, Health & Safety, Nanofluidics, Analysis Tools and Techniques, Lithography Metrology, Nanofabrication, Nanomanufacturing, and Nanoprocessing, Optical Properties of Materials, Critical Dimension and Overlay Metrology, Microfluidics, Microelectronics, Characterization, Nanometrology, and Nanoscale Measurements |
| PDF version: |  Click here to retrieve PDF version of paper (407KB) |