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|Author(s):||James R. Baker-Jarvis; Michael D. Janezic; Donald C. DeGroot;|
|Title:||High-Frequency Dielectric Measurements: A Tutorial|
|Published:||April 01, 2010|
|Abstract:||KNOWLEDGE of the response of materials to electromagnetic (EM) fields in the frequency range of radio frequency (RF) through terahertz (THz) is critical to numerous research projects and electronic product development activities. Electromagnetic waves in this high-frequency range achieve behaviors that low-frequency signals cannot achieve, such as the ability to travel through guided-wave structures, the ability to launch from antennas as propagating waves, the ability to carry broadband information over long distances, and the ability to propagate through materials. When applying high-frequency EM fields in scientific exploration and product development, researchers and engineers demand accurate material parameters in order to extract experimental results and to predict their products behavior[1-3].|
|Citation:||IEEE Instrumentation and Measurement Magazine|
|Pages:||pp. 24 - 30|
|Keywords:||Dielectric, microwave, nanoscale, PCB, resonator, transmission line|
|Research Areas:||Measurements, Electromagnetics|