| Author(s): |
Shiv K. Jaiswal; Yi-hua Tang; |
| Title: |
Direct Comparison between the NIST 10 V Compact Josephson Voltage Standard and 2.5 V Programmable Josephson Voltage Standard |
| Published: |
September 01, 2009 |
| Abstract: |
The NIST 10V Compact Josephson Voltage Standard (CJVS) and 2.5V Programmable Josephson Voltage Standard (PJVS) were directly compared at 1.018 V and 2.511 V in February 2007. The difference between the two systems at 1.018 V (i.e. CJVS PJVS) was -0.09 nV with expanded uncertainty of 4.72 nV or relative uncertainty of 4.72 10-9 for 95% confidence level, where as at the 2.511 V, the difference was 0.00 nV with expanded uncertainty of 4.04 nV or the relative uncertainty of 1.61 10-9 for 95% confidence level. These intercomparison results demonstrated the satisfactory performance of CJVS system with minor trapped flux in the array and effectiveness of NISTVolt software to take care of step jumps in the measurements. |
| Citation: |
Journal of Metrology Society of India |
| Pages: |
10 pp. |
| Keywords: |
compact Josephson voltage standard CJVS), intercomparison, programmable Josephson voltage standard (PJVS), uncertainty |
| Research Areas: |
Quantum Electrical Measurements |
| PDF version: |
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