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PUBLICATIONS

Accurate Transmission Line Characterization

Published

Author(s)

Dylan F. Williams, Roger Marks

Abstract

This letter introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance, and conductance per unit length of coplanar waveguide transmission lines fabricated on lossy silicon substrates.
Citation
IEEE Microwave and Guided Wave Letters
Volume
3
Issue
8
Pub Type
Journals

Download Paper

https://doi.org/10.1109/75.242226
Electromagnetics

Citation

Williams, D. and Marks, R. (1993), Accurate Transmission Line Characterization, IEEE Microwave and Guided Wave Letters, [online], https://doi.org/10.1109/75.242226 (Accessed April 25, 2024)

Created August 1, 1993, Updated November 10, 2018