Publication Citation
NIST Authors in Bold
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| Author(s): | Richard G. Geyer; |
|---|---|
| Title: | Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes |
| Published: | June 01, 1997 |
| Abstract: | |
| Proceedings: | Tech. Dig., IEEE MTT-S International Microwave Symposium |
| Pages: | pp. 1347 - 1350 |
| Location: | Denver, CO |
| Dates: | June 8-12, 1997 |
| Research Areas: | Electromagnetics |