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Publication Citation: Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes

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Author(s): Richard G. Geyer;
Title: Complex Permittivity Measurements of Extremely Low Loss Dielectric Materials Using Whispering Gallery Modes
Published: June 01, 1997
Abstract:
Proceedings: Tech. Dig., IEEE MTT-S International Microwave Symposium
Pages: pp. 1347 - 1350
Location: Denver, CO
Dates: June 8-12, 1997
Research Areas: Electromagnetics