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Publication Citation: Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

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Author(s): Xiaohong Gu; Mark R. VanLandingham; Michael J. Fasolka; Jonathan W. Martin; J Y. Jean; Tinh Nguyen;
Title: Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity
Published: February 26, 2003
Abstract: In this study, a well-controlled humidity system is used to enhance the sensitivity of A-FM in characterizing surface chemical heterogeneity. The relative humidity of the tip-sample environment is controlled using a humidity generator and a novel small-volume environmental chamber designed and fabricated. The relative humidity in the chamber can be controlled from nearly 0 % relative humidity (RH) up to 95 % RH at room temperature. The effects of relative humidity on AFM image contrast are studied using a patterned SAM sample and polymers withalternating regions of hydrophobic and hydrophilic materials. The results clearly demonstrate that the image contrast between the hydrophilic and hydrophobic regions of a surface is substantially increased by elevated relative humidity in the measurement environment.
Conference: Adhesion Society Meeting
Proceedings: Proceedings of the 26th Annual Meeting of the Adhesion Society
Pages: pp. 185 - 187
Dates: February 23-26, 2003
Keywords: Atomic Force Microscopy (AFM);humidity;relative humidity (RH)
Research Areas:
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