Nanocharacterization of Surface and Interface of Different Epoxy Networks

Published

January 1, 2002

Author(s)

Xiaohong Gu, D T. Raghavan, D L. Ho, Li Piin Sung, Mark R. VanLandingham, Tinh Nguyen

Abstract

The effect of network changes on the surface and interface properties of amine-cured epoxy has been investigated. Samples of different crosslinked epoxies are prepared by mixing stoichiometrically pure diglycidyl ether of bisphenol A (n=0.03) with different ratios of 1,3-bis(aminomethyl)cyclohexane (terafunctional amine) and cyclohexylmethylamine (difunctional amine). All samples are cured in CO2-free air. Both the film surface in contact with air and that in contact with the silicon substrate (the interface) are analyzed using atomic force microscopy (AFM) and nanoindentation. Small angle neutron scattering (SANS), attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy, and contact angle measurements, are used to assist in the interpretation of AFM results. Substantial morphological and mechanical differences are observed between the surface and the interface for different crosslinked epoxies. The findings have strong implications on the wettablity, adhesion, and durability of amine-cured epoxies.

Citation

MRS Proceedings

Volume

710

Pub Type

Journals

Download Paper

Local Download

Keywords

amine-cured epoxy, atomic force microscopy, crosslinking density, epoxy networks, Small angle neutron scattering, surface and interface

Citation

Gu, X. , Raghavan, D. , Ho, D. , Sung, L. , VanLandingham, M. and Nguyen, T. (2002), Nanocharacterization of Surface and Interface of Different Epoxy Networks, MRS Proceedings, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=860415 (Accessed April 24, 2024)