NIST Authors in Bold
| Author(s): | Sangcheol Kim; A Sehgal; Alamgir Karim; Michael J. Fasolka; |
|---|---|
| Title: | Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research |
| Published: | January 01, 2003 |
| Abstract: | |
| Citation: | Techniques for Combinatorial and High-Throughput Microscopy, Part 2: Automated Optical Microscopy Platform for Thin Film Research |
| Keywords: | Combinatorial and THE Methods;Informatics;Microscopy;Thin Films;combinatorial methods;film thickness;gradient libraries;high-throughput materials science;surface energy gradient;temperature gradient;thin films |
| Research Areas: | |
| PDF version: | Click here to retrieve PDF version of paper (4MB) |