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Publication Citation: Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

NIST Authors in Bold

Author(s): Xiaohong Gu; Mark R. VanLandingham; Michael J. Fasolka; Jonathan W. Martin; J Y. Jean; Tinh Nguyen;
Title: Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity
Published: January 01, 2003
Abstract:
Conference: Proceedings of the 26th Annual Meeting of the Adhesion Society
Location: Myrtle Beach, SC
Keywords: Atomic Force Microscopy (AFM),Combinatorial and THE Methods,Microscopy,Nanostructured Materials,humidity,relative humidity (RH)
Research Areas:
PDF version: PDF Document Click here to retrieve PDF version of paper (893KB)