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Publication Citation: Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity

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Author(s): Xiaohong Gu; Mark R. VanLandingham; Michael J. Fasolka; Jonathan W. Martin; J Y. Jean; Tinh Nguyen;
Title: Enhancing Sensitivity of Atomic Force Microscopy for Characterizing Surface Chemical Heterogeneity
Published: January 01, 2003
Abstract:
Conference: Proceedings of the 26th Annual Meeting of the Adhesion Society
Location: Myrtle Beach, SC
Keywords: Atomic Force Microscopy (AFM);Combinatorial and THE Methods;Microscopy;Nanostructured Materials;humidity;relative humidity (RH)
Research Areas:
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