| Author(s): |
Gheorghe Stan; Robert F. Cook; |
| Title: |
Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy |
| Published: |
November 13, 2008 |
| Abstract: |
Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant variation in the contact area over granular topography arises as the probe is either in single- or multiple-asperity contact with the surface. Consequently, in extracting the elastic modulus from CR-AFM measurements on granular surfaces we considered both the normal and lateral couplings established through multi-asperity contacts between the tip and the surface. |
| Citation: |
Nanotechnology |
| Volume: |
19 |
| Pages: |
10 pp. |
| Keywords: |
mechanical properties;nanoscale |
| Research Areas: |
Characterization, Ceramics |
| PDF version: |
 Click here to retrieve PDF version of paper (1MB) |
