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|Author(s):||Gheorghe Stan; Robert F. Cook;|
|Title:||Mapping the Elastic Properties of Granular Au Films by Contact Resonance Atomic Force Microscopy|
|Published:||November 13, 2008|
|Abstract:||Endowed with nanoscale spatial resolution, contact resonance atomic force microscopy (CR-AFM) provides extremely localized elastic property measurements. We advance here the applicability of CR-AFM on surfaces with nanosize features by considering the topography contribution to the CR-AFM signal. On nanosize granular Au films, the elastic modulus at the grain scale has been mapped out by considering a self-consistent deconvolution of the contact geometry effect in the CR-AFM image. Significant variation in the contact area over granular topography arises as the probe is either in single- or multiple-asperity contact with the surface. Consequently, in extracting the elastic modulus from CR-AFM measurements on granular surfaces we considered both the normal and lateral couplings established through multi-asperity contacts between the tip and the surface.|
|Research Areas:||Ceramics, Characterization|
|PDF version:||Click here to retrieve PDF version of paper (1MB)|