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Publication Citation: Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers

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Author(s): John E. Bonevich; D van Heerden; Daniel Josell;
Title: Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers
Published: May 01, 1999
Abstract: The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.
Citation: Journal of Materials Research
Volume: 14
Issue: No. 5
Keywords: aluminum;multilayer;thin film;titanium;transformation;transmission electron microscopy;x-ray diffraction
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