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|Author(s):||John E. Bonevich; D van Heerden; Daniel Josell;|
|Title:||Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers|
|Published:||May 01, 1999|
|Abstract:||The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM.|
|Citation:||Journal of Materials Research|
|Keywords:||aluminum,multilayer,thin film,titanium,transformation,transmission electron microscopy,x-ray diffraction|