| Author(s): |
John E. Bonevich; D van Heerden; Daniel Josell; |
| Title: |
Face-Centered Cubic Titanium: An Artifact in Titanium/Aluminum Multilayers |
| Published: |
May 01, 1999 |
| Abstract: |
The present investigation is the first comprehensive comparative study of x-ray diffraction (XRD) and transmission electron microscopy (TEM) results to address the important issue of fcc Ti formation in nanoscale multilayers Ti/Al multilayers with 7.2 and 5.2 nm composition modulation wavelengths were studied by reflection and transmission XRD as well as transmission electron diffraction (ED), high-resolution TEM, and energy-filtered TEM. Previous reports have claimed deposition of fcc Ti in multilayer systems. Our results demonstrate that the Ti in Ti/Al multilayers deposits in the hcp form and that fcc Ti is merely an artifact of producing specimens for cross-sectional TEM. |
| Citation: |
Journal of Materials Research |
| Volume: |
14 |
| Issue: |
No. 5 |
| Keywords: |
aluminum;multilayer;thin film;titanium;transformation;transmission electron microscopy;x-ray diffraction |
| Research Areas: |
|
