DeLongchamp, D.
, Kline, R.
, Lin, E.
, Fischer, D.
, Richter, L.
, Lucas, L.
, Heeney, M.
, McCulloch, I.
and Northrup, J.
(2007),
High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory, Advanced Materials, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=852643
(Accessed April 25, 2024)
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High Carrier Mobility Polythiophene Thin Films: Structure Determination by Experiment and Theory
Published
Author(s)
, , , , , , Martin Heeney, Iain McCulloch, John E. Northrup
Abstract
We exploit the unprecedented crystallinity of poly(2,5-bis(3-alkylthiophene-2-yl)thieno[3,2-b]thiophenes) (pBTTTs) high performance semiconducting polymers to study structural detail within 25 nm thick films of a pBTTT with tetradecyl side chains (pBTTT-C14). The combination of atomic force microscopy, near -edge X-ray absorption fine structure (NEXAFS) spectroscopy and and infrared absorption spectroscopy reveals stucture more detailed than what can be revealed using conventional X-ray diffraction techniques. We find that the conjugated planes of pBTTT-C14 tilt within their crystalline lamellae, an important structural property theoretically predicted but never before experimentally shown in conjugated polymers.Citation
Advanced Materials
Pub Type
Journals
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Keywords
NEXAFS, organic semiconductor, transistor, X-ray absorption spectroscopy
Citation
Created March 19, 2007, Updated February 19, 2017