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|Author(s):||Donna C. Hurley; J Turner;|
|Title:||Relative humidity effects on the determination of elastic properties with atomic force acoustic microscopy|
|Published:||March 01, 2004|
|Abstract:||We have investigated how ambient humidity can affect quantitative measurements of elastic properties on the nanoscale. Using an emerging technique called atomic force acoustic microscopy (AFAM), two samples were examined: a thin film of fluorosilicate glass (FSG) and a section of borosilicate glass. When experimental results were analyzed using a simple model of the AFM is believed to be due to the presence of a humidity-dependent layer of water on the sample. To account for this, the data analysis model was extended to include ciscoelastic damping between the tip and the sample. A damping term proportional to the relative identation modulus M from k* yielded similar values regardless of measurement humidity. These results indicate that environment conditions can influence quantitative nanoscale measurements of elastic properties, at least in some materials.|
|Citation:||Journal of Applied Physics|
|Pages:||pp. 2403 - 2407|
|Keywords:||AFAM,elastic properties,relative humidity,ultrasonics|
|PDF version:||Click here to retrieve PDF version of paper (83KB)|