| Author(s): |
J -. Guin; Sheldon M. Wiederhorn; |
| Title: |
Fracture of Silicate Glasses: Ductile or Brittle? |
| Published: |
Date Unknown |
| Abstract: |
Atomic force microscopy is used to investigate the possibility of crack tip cavitation during crack growth in silicate glasses. Matching areas on both surfaces of a crack were mapped and then compared for soda-lime silicate glass and for silica glass. For both glasses surfaces matched to better than 0.3 nm normal to the surface and 5 nm parallel to the surface. We could find no evidence for cavity formation in our study and suggest that completely brittle fracture occurs in glass. |
| Citation: |
Physical Review Letters |
| Keywords: |
atomic force microscopy;crack growth;fracture;glass |
| Research Areas: |
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