NIST logo

Publication Citation: Measurement of the Local Diattenuation and Retardance of Thin Polymer Films Using Near-Field Polarimetry

NIST Authors in Bold

Author(s): Lori S. Goldner; Michael J. Fasolka; S N. Goldie;
Title: Measurement of the Local Diattenuation and Retardance of Thin Polymer Films Using Near-Field Polarimetry
Published: January 01, 2005
Abstract: Near-field scanning optical microscopy and Fourier analysis polarimetry are combined to obtain quantitative maps of the local retardance, (resulting from strain or crystalline birefringence), fast axis orientation, diattenuation and diattenuating axis orientation in nanostructured polymer thin films. Lateral resolution of 50 nm with retardance sensitivity as small as 1 mrad has been demonstrated in images of isotactic PS crystallites and diblock copolymer morphologies.
Citation: Acs Symposium Series
Volume: 897
Keywords: diblock copolymer;near-field;near-field scanning optical microscopy;NSOM;polarimetry;polymer;polymer crystals;SNOM;thin films
Research Areas: