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Publication Citation: Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K

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Author(s): Simon G. Kaplan; M E. Thomas;
Title: Measurement of the O-ray and E-ray Infrared Refractive Index and Absorption Coefficients of Sapphire From 10K to 295K
Published: September 01, 2002
Abstract: We present the results of index of refraction and absorption coefficient measurements of high-quality optical grade sapphire over the 1850 cm-1 10000 cm-1 wave number range and temperatures from 10 K to 295 K. The refractive index is determined by a combination of room-temperature minimum-deviation prism measurements at 2950 cm-1 and temperature dependent high-resolution transmission measurements of a 1 mm thick etalon sample from the same batch of material. A Brewster-angle polarizer with an extinction ratio of <10-5 is used for polarization selection. The uncertainties in the fringe counting method are analyzed. The temperature dependence of the absorption coefficient is compared with the predictions of a multi-phonon model for sapphire.
Conference: Proceedings of SPIE--the International Society for Optical Engineering
Proceedings: Cryogenic Optical Systems and Instruments , Conference | 9th | Cryogenic Optical Systems and Instruments IX | SPIE
Dates: July 7-11, 2002
Keywords: absorption coefficient;index of refraxtion;sapphire;thermo-optic coefficient
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