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|Author(s):||Simon G. Kaplan; Leonard M. Hanssen;|
|Title:||Silicon as a Standard Material for Infrared Reflectance and Transmittance From 2 to 5 m|
|Published:||December 01, 2002|
|Abstract:||We have investigated the specular reflectance and transmittance of polished, high-resistivity single-crystal Si in the spectral range from 2 m to 5 m. Measurements were performed with a nearly collimated (-0.7 divergence) beam at angles of incidence from 12 degrees to 80 degrees, and a spectral resolution of 16 cm-1. The measured values agree with the expected values obtained from the published index of refraction of Si to within +0.002. This represents a substantial reduction in experimental uncertainty compared to previous results and demonstrates the usefulness of Si as a standard material for infrared reflectance and transmittance.|
|Citation:||Infrared Physics and Technology|
|Keywords:||index of refraction,infrared,polarization,reflectance,transmittance`|