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Publication Citation: Non-Contact Temperature Measurements of Micro-Scale Phenomena

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Author(s): Howard W. Yoon;
Title: Non-Contact Temperature Measurements of Micro-Scale Phenomena
Published: Date Unknown
Abstract: Imaging trying to make temprature measurements in a spatial region equal to the edge of a printer paper or within the diameter of a strand of hair. The accurate computer modeling of the machining process requires measurements of the thermodynamic temperatures of the tool-chip interface with spatial resolution of few {micro}m and time resolution ranging from steady-state measurements fo continuous processes to fast ({micro}s) measurements of chaotic or random processes. Similar requirements exist in optimization of micro-heater arrays in combinatorial chemistry and in the diagnostics of heat-related failures in integrated circuit devices. The impact of successful micro-scale thermodynamic temperature measurements in these applications could be wide-ranging with new applications found for the micro-heater plates to substantial savings in manufacturing costs resulting from accurate models of the tool-chip interface.
Citation: Non-Contact Temperature Measurements of Micro-Scale Phenomena
Keywords: machining process modeling;micro-heater arrays;non-contact temperature measurements;thermodynamic temperature measurements;tool-chip interface
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