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Publication Citation: Correlated Photon Based Metrology Without Absolute Standards

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Author(s): Alan L. Migdall;
Title: Correlated Photon Based Metrology Without Absolute Standards
Published: January 01, 1999
Abstract: Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.
Citation: Physics Today
Keywords: correlated photon;down-conversion;metrology;polarization mode dispersion;quantum efficiency;radiance
Research Areas:
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