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|Author(s):||Alan L. Migdall;|
|Title:||Correlated Photon Based Metrology Without Absolute Standards|
|Published:||January 01, 1999|
|Abstract:||Pairs of photons produced two at a time via optical parametric down-conversion have proved to be a useful tool for metrology. The status of three such applications is presented. One common theme through each of these applications is that they offer absolute results without any externally calibrated standards.|
|Keywords:||correlated photon,down-conversion,metrology,polarization mode dispersion,quantum efficiency,radiance|
|PDF version:||Click here to retrieve PDF version of paper (8MB)|