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|Author(s):||Leonard M. Hanssen; Simon G. Kaplan;|
|Title:||Problems Posed by Scattering Transmissive Materials for Accurate Transmittance and Reflectance Measurements|
|Abstract:||The characterization of the spectral transmittance and reflectance of windows and other optical components is a basic and important measurement. In principal, the measurements are relatively straightforward. However, even with an ideal high-accuracy measurement system, the sample s scattering properties can render the measurement results inaccurate or easily misinterpreted. The effects of low levels of scatter from specular transmissive samples on optical property measurements are demonstrated in the infrared with specular and hemispherical detection instrumentation. Complete measurement of the reflected, transmitted, and scattered light from these samples is demonstrated in the infrared using a center-mount integrating sphere.|
|Keywords:||edge effects,hemispherical detection,infrared,integrating sphere,reflectance,scattering,transmittance|